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Electron microscope(plant) - メーカー・企業と製品の一覧

Electron microscopeの製品一覧

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JSM-IT510 InTouchScope Scanning Electron Microscope

The observation work of SEM has become more efficient and easier to perform.

Japan Electron Optics Corporation JSM-IT510 InTouchScope Scanning Electron Microscope The Scanning Electron Microscope (SEM) has become an essential tool not only for research but also for quality assurance and manufacturing environments. In such settings, it is necessary to repeatedly perform the same observation tasks, leading to a demand for process efficiency. The JSM-IT510, with its newly added Simple SEM function, allows for more efficient and easier SEM observation tasks. 〇Features - Simple SEM: Just select the field of view you want to capture - Safe and easy! Sample exchange guidance - Zeromag: Magnifying the optical image reveals the SEM image - Live Analysis / Live Map: Continuous elemental analysis during observation - Comprehensive features *For more details, please download the PDF or feel free to contact us.

  • Electron microscope

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Introduction of recommended products from Azusa Science.

It can be utilized in various fields such as medicine, biology, metals, semiconductors, and ceramics.

Here, we introduce three products from Japan Electron Optics Laboratory Co., Ltd., recommended by Azusa Science, which are electron microscopes. ■ JSM-IT200 InTouchScope Scanning Electron Microscope The features of this higher-end model have been simplified for easier use. With a user-friendly sample exchange guide, it allows for easy sample setup, finding the field of view, and starting SEM image observation. It integrates software for analytical tasks. ■ JCM-7000 NeoScope Desktop Scanning Electron Microscope With the concept of "Anyone can operate SEM/EDS," it meets the needs for improved work efficiency, ease of operation, and enhanced analysis and measurement performance. Placing one next to an optical microscope allows for faster and more detailed foreign object analysis and quality control. ■ JSM-IT510 InTouchScope Scanning Electron Microscope In quality assurance and manufacturing environments, it is necessary to repeatedly perform the same observation tasks, leading to demands for process efficiency. The JSM-IT510 features a newly added Simple SEM function that allows for "hands-free" repetitive tasks. It has become easier and more efficient to conduct SEM observation tasks.

  • JSM-IT200 InTouchScope? 走査電子顕微鏡.png
  • JSM-IT510 InTouchScope? 走査電子顕微鏡.png
  • Electron microscope

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ブックマークを削除いたしました

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