JSM-IT510 InTouchScope Scanning Electron Microscope
The observation work of SEM has become more efficient and easier to perform.
Japan Electron Optics Corporation JSM-IT510 InTouchScope Scanning Electron Microscope The Scanning Electron Microscope (SEM) has become an essential tool not only for research but also for quality assurance and manufacturing environments. In such settings, it is necessary to repeatedly perform the same observation tasks, leading to a demand for process efficiency. The JSM-IT510, with its newly added Simple SEM function, allows for more efficient and easier SEM observation tasks. 〇Features - Simple SEM: Just select the field of view you want to capture - Safe and easy! Sample exchange guidance - Zeromag: Magnifying the optical image reveals the SEM image - Live Analysis / Live Map: Continuous elemental analysis during observation - Comprehensive features *For more details, please download the PDF or feel free to contact us.
- Company：アズサイエンス 松本本社
- Price：10 million yen-50 million yen
